CHARGE-TRANSFER, POLARIZATION, AND RELAXATION EFFECTS ON THE AUGER LINE-SHAPES OF SI

被引:71
作者
RAMAKER, DE [1 ]
HUTSON, FL [1 ]
TURNER, NH [1 ]
MEI, WN [1 ]
机构
[1] GEORGE WASHINGTON UNIV,DEPT CHEM,WASHINGTON,DC 20052
来源
PHYSICAL REVIEW B | 1986年 / 33卷 / 04期
关键词
D O I
10.1103/PhysRevB.33.2574
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:2574 / 2588
页数:15
相关论文
共 133 条
[1]  
AGGARWAL RL, 1965, PHYS REV A, V138, P882
[2]   ARGON KLL AND KLM AUGER-ELECTRON SPECTRA [J].
ASPLUND, L ;
KELFVE, P ;
BLOMSTER, B ;
SIEGBAHN, H ;
SIEGBAHN, K .
PHYSICA SCRIPTA, 1977, 16 (5-6) :268-272
[3]  
BABENKOV MI, 1976, IZV AN SSSR FIZ+, V40, P2065
[4]   KMM AUGER TRANSITIONS IN ATOMS HAVING 46-LESS-THAN-OR-EQUAL-TO-Z-LESS-THAN-OR-EQUAL-TO-84 [J].
BABENKOV, MI ;
BOBYKIN, BV ;
ZHDANOV, VS .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1983, 31 (04) :307-315
[5]   SILICON L2,3VV AUGER LINESHAPE AND OXYGEN-CHEMISORPTION STUDY OF PD4SI [J].
BADER, SD ;
RICHTER, L ;
BRODSKY, MB ;
BROWER, WE ;
SMITH, GV .
SOLID STATE COMMUNICATIONS, 1981, 37 (09) :729-732
[6]   L23 VV-AUGER SPECTRUM OF MAGNESIUM [J].
BARO, AM ;
TAGLE, JA .
JOURNAL OF PHYSICS F-METAL PHYSICS, 1978, 8 (03) :563-569
[7]   AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF SODIUM METAL AND SODIUM OXIDE [J].
BARRIE, A ;
STREET, FJ .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (01) :1-31
[8]  
BAUER RS, 1977, NUOVO CIMENTO B, V39, P464
[9]   A NEW METHOD FOR DETERMINING RELAXATION ENERGIES BY MEANS OF AES AND XPS AND ITS APPLICATION TO SILICON-COMPOUNDS [J].
BECHSTEDT, F ;
ENDERLEIN, R ;
FELLENBERG, R ;
STREUBEL, P ;
MEISEL, A .
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1983, 31 (02) :131-143
[10]   EFFECTS OF CONFIGURATION INTERACTION ON K-SHELL AUGER SPECTRUM OF NEON [J].
BHALLA, CP .
PHYSICS LETTERS A, 1973, A 44 (02) :103-104