ON THE RELIABILITY OF TESTLET-BASED TESTS

被引：172

作者：

SIRECI, SG

THISSEN, D

WAINER, H

机构：

[1] FORDHAM UNIV,BRONX,NY 10458

[2] EDUC TESTING SERV,PRINCETON,NJ 08541

[3] UNIV N CAROLINA,PSYCHOL,CHAPEL HILL,NC 27599

来源：

JOURNAL OF EDUCATIONAL MEASUREMENT | 1991年 / 28卷 / 03期

关键词：

D O I：

10.1111/j.1745-3984.1991.tb00356.x

中图分类号：

G44 [教育心理学];

学科分类号：

0402 ; 040202 ;

摘要：

If a test is constructed of testlets, one must take into account the within‐testlet structure in the calculation of test statistics. Failing to do so may yield serious biases in the estimation of such statistics as reliability. We demonstrate how to calculate the reliability of a testlet‐based test. We show that traditional reliabilities calculated on two reading comprehension tests constructed of four testlets are substantial overestimates. Copyright © 1991, Wiley Blackwell. All rights reserved

引用

页码：237 / 247

页数：11