THIN-FILM THICKNESS FROM THEORETICAL EXPRESSIONS FOR CONDUCTIVITY + ISOTHERMAL HALL EFFECT

被引：11

作者：

LEONARD, WF

RAMEY, RL

机构：

来源：

关键词：

D O I：

10.1063/1.1713138

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2963 / &

共 7 条

[1]

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[3]

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STILWELL, GR .

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SONDHEIMER, EH .

PHYSICAL REVIEW, 1950, 80 (03) :401-406

[6] THE MEAN FREE PATH OF ELECTRONS IN METALS [J].

SONDHEIMER, EH .

[7]

Wilson A. H., 1953, THEORY METALS, P4