HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY

被引：76

作者：

PEASE, RFW

NIXON, WC

机构：

来源：

JOURNAL OF SCIENTIFIC INSTRUMENTS | 1965年 / 42卷 / 02期

关键词：

D O I：

10.1088/0950-7671/42/2/305

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：81 / &

共 10 条

[1]

BRONSHTEIN IM, 1962, SOV PHYS-SOL STATE, V3, P2337

[2]

BRONSHTEIN IM, 1961, SOV PHYS-SOL STATE, V3, P995

EVERHART, TE ;

THORNLEY, RFM .

JOURNAL OF SCIENTIFIC INSTRUMENTS, 1960, 37 (07) :246-248

KANTER, H .

PHYSICAL REVIEW, 1961, 121 (03) :681-&

[5] A UNIFIED REPRESENTATION OF MAGNETIC ELECTRON LENS PROPERTIES [J].

LIEBMANN, G .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (10) :737-745

[6] THE MAGNETIC PINHOLE ELECTRON LENS [J].

LIEBMANN, G .

PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON SECTION B, 1955, 68 (09) :682-685

[7]

Rose A., 1948, ADV ELECTRON EL P, P131, DOI DOI 10.1016/S0065-2539(08)61102-6

[8] THE SCANNING ELECTRON MICROSCOPE AND ITS FIELDS OF APPLICATION [J].

SMITH, KCA ;

OATLEY, CW .

BRITISH JOURNAL OF APPLIED PHYSICS, 1955, 6 (11) :391-399

[9]

SMITH KCA, 1960, P EUROPEAN REGIONAL, V1, P177

[10]

ZWORYKIN VK, 1945, ELECTRON OPTICS ELEC, P207