THE MICROSTRUCTURE OF RUO2 THICK-FILM RESISTORS AND THE INFLUENCE OF GLASS PARTICLE-SIZE ON THEIR ELECTRICAL-PROPERTIES

被引:29
作者
INOKUMA, T [1 ]
TAKETA, Y [1 ]
HARADOME, M [1 ]
机构
[1] NIHON UNIV,PHYS SCI LABS,NARASHINO,CHIBA,JAPAN
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1984年 / 7卷 / 02期
关键词
D O I
10.1109/TCHMT.1984.1136345
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:166 / 175
页数:10
相关论文
共 17 条
[1]  
Bratschun W. R., 1977, 27th Electronic Components Conference, P161
[2]   INFLUENCE OF METAL MIGRATION FROM SCREEN-AND-FIRED TERMINATIONS ON ELECTRICAL CHARACTERISTICS OF THICK-FILM RESISTORS [J].
CATTANEO, A ;
COCITO, M ;
FORLANI, F ;
PRUDENZIATI, M .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1977, 4 (3-4) :205-211
[3]  
CELASCO M, 1979, 1979 P EUR HYBR MICR, P105
[4]  
CHEN TM, 1977, 1977 P INT MICR S BA, P72
[5]  
CONRADT R, 1980, 1980 P INT MICR C, P66
[6]   ELECTRICAL-CONDUCTION BY PERCOLATION IN THICK-FILM RESISTORS [J].
FORLANI, F ;
PRUDENZIATI, M .
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1976, 3 (02) :77-83
[7]  
HARPER CA, 1974, HDB THICK FILM HYBRI, pCH6
[8]  
KASUKABE S, 1980, 1980 P INT MICR C, P205
[9]  
PRUDENZIATI M, 1981, 1981 P EUR HYBR MICR, P1
[10]  
RAPELI JHA, 1981, 1981 P EUR HYBR MICR, P239