X-RAY-POWDER DIFFRACTION ANALYSIS OF THE ELECTRON SUPERCONDUCTOR ND2-XTHXCUO4 SYSTEM

被引:8
作者
HUANG, TC
WANG, PW
MORAN, E
NAZZAL, AI
TORRANCE, JB
机构
[1] IBM Almaden Research Cent, United States
关键词
Crystals--Structure - Oxides--Electric Conductivity;
D O I
10.1016/0025-5408(89)90051-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The polycrystalline structure of the superconducting Nd2-xThxCuO4 system is studied using the X-ray diffraction technique. High-quality X-ray powder diffraction data are obtained, and analysis shows that the Nd2-xThxCuO4 compounds synthesized by solid-state reaction are well crystallized and have a body-centered tetragonal T-structure. A minor amount of Cu2O is detected, suggesting a possible Cu deficiency in the x≥0.10 compounds. A significant amount (in the 10% range) of unreacted ThO2 is also found in the x=0.25 sample, which confirms the Th solubility limit in Nd2-xThxCuO4 is 0.20. New X-ray powder diffraction data with excellent figures of merit of F30>210 and M20>260 of the superconductor Nd1.85Th0.15CuO4 and its parent compound Nd2CuO4 are reported. Values of the lattice dimensions with an estimated precision of 2.5 × 10-5 are by least-squares refinements from 32 to 33 reflections in the front reflection region.
引用
收藏
页码:875 / 881
页数:7
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