THIN-LAYER ACTIVATION - A TECHNIQUE FOR MONITORING MATERIAL LOSS DURING HIGH-TEMPERATURE SURFACE DEGRADATION PROCESSES

被引:12
作者
ASHER, J [1 ]
BENNETT, MJ [1 ]
HAWES, RWM [1 ]
PRICE, JB [1 ]
TUSON, AT [1 ]
SAVAGE, DJ [1 ]
SUGDEN, S [1 ]
机构
[1] UKAEA,DIV MAT DEV,HARWELL OX11 0RA,BERKS,ENGLAND
来源
MATERIALS SCIENCE AND ENGINEERING | 1987年 / 88卷
关键词
D O I
10.1016/0025-5416(87)90078-4
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:143 / 150
页数:8
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