THE RELATIONSHIP BETWEEN CHEMICAL-COMPOSITION AND SUPERCONDUCTIVITY IN THE TL-BA-CA-CU-O SUPERCONDUCTORS

被引：25

作者：

HIBBLE, SJ ^{[1
]}

CHEETHAM, AK ^{[1
]}

CHIPPINDALE, AM ^{[1
]}

DAY, P ^{[1
]}

HRILJAC, JA ^{[1
]}

机构：

[1] UNIV OXFORD,INORGAN CHEM LAB,OXFORD OX1 3PD,ENGLAND

来源：

PHYSICA C | 1988年 / 156卷 / 04期

关键词：

D O I：

10.1016/0921-4534(88)90029-9

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：604 / 606

页数：3

共 18 条

[1] POWDER X-RAY AND NEUTRON-DIFFRACTION STUDY OF THE SUPERCONDUCTOR BI2SR2CACU2O8
BORDET, P
CAPPONI, JJ
CHAILLOUT, C
CHENAVAS, J
HEWAT, AW
HEWAT, EA
HODEAU, JL
MAREZIO, M
THOLENCE, JL
TRANQUI, D
[J]. PHYSICA C, 1988, 153 : 623 - 624
[2] CONTROL OF COPPER VALENCE IN BI2SR2-XCACU2O8
CHEETHAM, AK
CHIPPINDALE, AM
HIBBLE, SJ
[J]. NATURE, 1988, 333 (6168) : 21 - 21
[3] AN INVESTIGATION OF THE BISMUTH-RHENIUM-OXYGEN SYSTEM BY ANALYTICAL ELECTRON-MICROSCOPY
CHEETHAM, AK
RAESMITH, AR
[J]. MATERIALS RESEARCH BULLETIN, 1981, 16 (01) : 7 - 14
[4] AN INVESTIGATION OF THE LOW OXIDATION-STATE CHEMISTRY OF RHENIUM IN THE BAO-RE-RE2O7 PHASE-DIAGRAM
CHEETHAM, AK
THOMAS, DM
[J]. JOURNAL OF SOLID STATE CHEMISTRY, 1987, 71 (01) : 61 - 69
[5] X-RAY-MICROANALYSIS OF THIN-CRYSTALS IN THE ELECTRON-MICROSCOPE AND ITS APPLICATION TO SOLID-STATE CHEMISTRY
CHEETHAM, AK
SKARNULIS, AJ
[J]. ANALYTICAL CHEMISTRY, 1981, 53 (07) : 1060 - 1064
[6] QUANTITATIVE LIGHT-ELEMENT ANALYSIS BY ANALYTICAL ELECTRON-MICROSCOPY
CHEETHAM, AK
SKARNULIS, AJ
THOMAS, DM
IBE, K
[J]. JOURNAL OF THE CHEMICAL SOCIETY-CHEMICAL COMMUNICATIONS, 1984, (23) : 1603 - 1604
[7] CHEMICAL CHARACTERIZATION AND SUPERCONDUCTIVITY OF 2 PHASES IN THE BI-SR-CA-CU-O SYSTEM
CHIPPINDALE, AM
HIBBLE, SJ
HRILJAC, JA
COWEY, L
BAGGULEY, DMS
DAY, P
CHEETHAM, AK
[J]. PHYSICA C, 1988, 152 (02): : 154 - 156
[8] QUANTITATIVE-ANALYSIS OF THIN SPECIMENS
CLIFF, G
LORIMER, GW
[J]. JOURNAL OF MICROSCOPY-OXFORD, 1975, 103 (MAR): : 203 - 207
[9] MICROSTRUCTURAL MODULATIONS IN SUPERCONDUCTING BI(SR,CA)1.33CUOX
GAI, PL
DAY, P
[J]. PHYSICA C, 1988, 152 (04): : 335 - 338
[10] HEINRICH KFJ, 1966, ELECTRON MICROPROBE, P350

← 1 2 →