DIELECTRIC LOSSES IN ORGANIC MONOMOLECULAR LAYERS

被引：12

作者：

MARC, G ^{[1
]}

MESSIER, J ^{[1
]}

机构：

[1] CTR ETUD NUCL SACLAY,SERV ELECTR SACLAY,BP 2,91190 GIF-SUR-YVETTE,FRANCE

来源：

JOURNAL OF APPLIED PHYSICS | 1974年 / 45卷 / 07期

关键词：

D O I：

10.1063/1.1663687

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2832 / 2835

页数：4

共 19 条

[1] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS [J].

AGARWAL, VK ;

SRIVASTAVA, VK .

THIN SOLID FILMS, 1971, 8 (05) :377-+

[2] DIELECTRIC PROPERTIES OF THIN FILMS OF ALUMINIUM OXIDE AND SILICON OXIDE [J].

ARGALL, F ;

JONSCHER, AK .

THIN SOLID FILMS, 1968, 2 (03) :185-&

[3]

BARRAUD A, 1971, CEACONF1872 AVISEM

[4]

BARRAUD A, 1970, CEACONF1587

[5]

BARRAUD A, 1970, CEACONF1494

[6]

BOOIJ HC, 1967, J POLYM SCI C, V16, P1761

[7]

GRUNDLACH KH, 1972, PHYS STATUS SOLIDI A, V10, P371

[8]

GUIROY G, 1970, CHIMIE MACROMOLECULA, pCH12

[9] ELECTRICAL AND STRUCTURAL PROPERTIES OF LANGMUIR FILMS [J].

HANDY, RM ;

SCALA, LC .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1966, 113 (2P1) :109-&

[10] ELECTRIC CONDUCTION THROUGH THIN INSULATING LANGMUIR FILM [J].

HORIUCHI, S ;

YAMAGUCHI, J ;

NAITO, K .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1968, 115 (06) :634-+

← 1 2 →