BENEFITS OF HIGH-RESOLUTION ELECTRON-MICROSCOPY FOR THE STRUCTURAL CHARACTERIZATION OF MULLITES

被引：29

作者：

EPICIER, T

机构：

[1] Institut National des Sciences Appliquées de Lyon, Groupe d'Etudes de Métallorgie Physique et de Physique des Matériaux, u.r.a. CNRS 341, Villeurbanne

来源：

JOURNAL OF THE AMERICAN CERAMIC SOCIETY | 1991年 / 74卷 / 10期

关键词：

D O I：

10.1111/j.1151-2916.1991.tb06769.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The structure of 3:2 mullites is investigated by high-resolution electron microscopy. Attention is paid to the identification of isolated defects, i.e., oxygen vacancies in pure 3:2 mullite and chromium interstitials in chromium-doped mullite. Models for such defects, including lattice reconstruction effects, are analyzed with the help of image simulations.

引用

页码：2359 / 2366

页数：8

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