RESONANCES IN PHOTOABSORPTION SPECTRA OF SIF4, SI(CH3)4, AND SICL4 NEAR THE SILICON K EDGE

被引：62

作者：

BODEUR, S

NENNER, I

MILLIE, P

机构：

[1] CENS, CEA, DEPT PHYSICOCHIM, F-91191 GIF SUR YVETTE, FRANCE

[2] LAB CHIM PHYS, F-75231 PARIS 05, FRANCE

来源：

PHYSICAL REVIEW A | 1986年 / 34卷 / 04期

关键词：

D O I：

10.1103/PhysRevA.34.2986

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：2986 / 2997

页数：12

共 67 条

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[5] SHAPE RESONANCES IN THE ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY OF THE SI 2P SHELL OF SICL4
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[6] ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY OF THE VALENCE ORBITALS OF SICL4 AS A FUNCTION OF PHOTON ENERGY FROM 14 TO 80 EV
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[7] Cauchois Y., 1978, WAVELENGTHS XRAY EMI
[8] KLL AUGER AND X-RAY PHOTOELECTRON-SPECTRA OF PHOSPHINE, SOME PHOSPHORUS HALIDES AND THE OTHER HYDRIDES ISOELECTRONIC WITH ARGON
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[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1979, 15 (JAN) : 145 - 150
[9] COSTALIMA MT, 1976, THESIS U PARIS 6
[10] EVIDENCE OF EFFECTIVE POTENTIAL BARRIERS IN X-RAY ABSORPTION-SPECTRA OF MOLECULES
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