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FLUX METHODS FOR ANALYSIS OF TRANSPORT PROBLEMS IN SEMICONDUCTORS IN PRESENCE OF ELECTRIC FIELDS

被引：25
作者：
MCKELVEY, JP
BALOGH, JC
机构：
来源：
PHYSICAL REVIEW | 1965年 / 137卷 / 5A期
关键词：
D O I：
10.1103/PhysRev.137.A1555
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
引用
收藏
页码：1555 / &
相关论文
共 4 条
[1]   ANALYSIS OF SEMICONDUCTOR PARA JUNCTIONS AND JUNCTION DEVICES BY A FLUX METHOD [J].
MCKELVEY, JP .
JOURNAL OF APPLIED PHYSICS, 1962, 33 (03) :985-&
[2]   ALTERNATIVE APPROACH TO SOLUTION OF ADDED CARRIER TRANSPORT PROBLEMS IN SEMICONDUCTORS [J].
MCKELVEY, JP ;
BRODY, TP ;
LONGINI, RL .
PHYSICAL REVIEW, 1961, 123 (01) :51-&
[3]   RECOMBINATION OF INJECTED CARRIERS AT DISLOCATION EDGES IN SEMICONDUCTORS [J].
MCKELVEY, JP ;
LONGINI, RL .
PHYSICAL REVIEW, 1955, 99 (04) :1227-1232
[4]   DIFFUSION AND DRIFT OF MINORITY CARRIERS IN SEMICONDUCTORS FOR COMPARABLE CAPTURE AND SCATTERING MEAN FREE PATHS [J].
SHOCKLEY, W .
PHYSICAL REVIEW, 1962, 125 (05) :1570-&
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