REAL-TIME X-RAY-DIFFRACTION USING SYNCHROTRON RADIATION - SYSTEM CHARACTERIZATION AND APPLICATIONS

被引：48

作者：

CAFFREY, M

BILDERBACK, DH

机构：

[1] CORNELL UNIV, CORNELL HIGH ENERGY SYNCHROTRON SOURCE, ITHACA, NY 14853 USA

[2] CORNELL UNIV, SCH APPL & ENGN PHYS, ITHACA, NY 14853 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 208卷 / 1-3期

关键词：

D O I：

10.1016/0167-5087(83)91173-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：495 / +

页数：1

共 34 条

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