DYNAMIC OBSERVATION OF AG DESORPTION PROCESS ON SI(111) SURFACE BY HIGH-TEMPERATURE SCANNING-TUNNELING-MICROSCOPY

被引:9
作者
SATO, T
SUEYOSHI, T
KITAMURA, S
IWATSUKI, M
机构
[1] JEOL Ltd., Akishima, Tokyo, 196
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 6B期
关键词
HIGH TEMPERATURE; SCANNING TUNNELING MICROSCOPY; SI(111); AG DESORPTION; PHASE TRANSITION;
D O I
10.1143/JJAP.32.2923
中图分类号
O59 [应用物理学];
学科分类号
摘要
The dynamical isothermal desorption process of Ag adsorbed on a Si(111) surface kept at about 600-degrees-C was observed by means of high-temperature scanning tunneling microscopy (HT-STM). The desorption of Ag caused a transition from the square-root 3 x square-root 3-Ag phase to the 3 x 1-Ag phase having a lower Ag coverage, followed by another transition to the 7 X 7 phase. In the respective phase transitions, the produced phases extended from steps and domain boundaries. The number of Si atoms moved is discussed for the case of the phase transition from the 3 x 1-Ag structure to the 7 x 7 structure.
引用
收藏
页码:2923 / 2928
页数:6
相关论文
共 10 条
[1]   A STUDY OF ADSORPTION AND DESORPTION PROCESSES OF AG ON SI(111) SURFACE BY MEANS OF RHEED-TRAXS [J].
HASEGAWA, S ;
DAIMON, H ;
INO, S .
SURFACE SCIENCE, 1987, 186 (1-2) :138-162
[2]   OBSERVATION OF SURFACE RECONSTRUCTION AND NANO-FABRICATION ON SILICON UNDER HIGH-TEMPERATURE USING A UHV-STM [J].
IWATSUKI, M ;
KITAMURA, S ;
SATO, T ;
SUEYOSHI, T .
APPLIED SURFACE SCIENCE, 1992, 60-1 :580-586
[3]  
IWATSUKI M, 1990, JEOL NEWS E, V28, P24
[4]   OBSERVATION OF SURFACE RECONSTRUCTION ON SILICON ABOVE 800-DEGREES-C USING THE STM [J].
KITAMURA, S ;
SATO, T ;
IWATSUKI, M .
NATURE, 1991, 351 (6323) :215-217
[5]  
KITAYAMA M, 1991, PHYS REV LETT, V66, P2762
[6]   COHESIVE ENERGY OF 2-DIMENSIONAL SI(111)-3 X 1 AG AND SI(111)SQUARE ROOT 3-R(30-DEGREES)AG PHASES OF SILVER (DEPOSIT)-SILICON(111) (SUBSTRATE) SYSTEM [J].
LELAY, G ;
MANNEVILLE, M ;
KERN, R .
SURFACE SCIENCE, 1978, 72 (02) :405-422
[8]  
TAKAHASHI T, 1991, 2ND P INT C SURF XRA
[9]   STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY [J].
TAKAYANAGI, K ;
TANISHIRO, Y ;
TAKAHASHI, M ;
TAKAHASHI, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03) :1502-1506
[10]   LOCAL ELECTRON-STATES AND SURFACE GEOMETRY OF SI(111)-(SQUARE-ROOT 3 X SQUARE-ROOT 3)AG [J].
VANLOENEN, EJ ;
DEMUTH, JE ;
TROMP, RM ;
HAMERS, RJ .
PHYSICAL REVIEW LETTERS, 1987, 58 (04) :373-376