HOLOGRAPHIC-INTERFEROMETRY USING SUBSTRATE GUIDED-WAVES

被引：4

作者：

HUANG, Q

GILBERT, JA

CAULFIELD, HJ

机构：

[1] UNIV ALABAMA,DEPT MECH & AEROSP ENGN,HUNTSVILLE,AL 35899

[2] ALABAMA A&M UNIV,DEPT PHYS,NORMAL,AL 35762

来源：

OPTICAL ENGINEERING | 1994年 / 33卷 / 04期

关键词：

HOLOGRAPHIC INTERFEROMETRY; NONDESTRUCTIVE EVALUATION; METROLOGY; WAVE-GUIDE HOLOGRAPHY;

D O I：

10.1117/12.163188

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new tool for experimental mechanics called substrate guided wave (SGW) holo-interferometry is described. The approach relies on recording and reconstructing time-average, double-exposure, and real-time holograms using light waves guided to the hologram by a dielectric sheet or substrate waveguide. The study illustrates that SGW holo-interferometry can be used to isolate the reference wavefront from the environment surrounding the hologram and can be applied to measure the mechanical properties of the substrate itself. These attributes are discussed along with experimental work performed to develop and refine the technique.

引用

页码：1132 / 1137

页数：6

共 15 条

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[2]

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[3]

BENTON SA, 1990, P SOC PHOTO-OPT INS, V1212, P149, DOI 10.1117/12.17977

[4]

Erf R., 1974, HOLOGRAPHIC NONDESTR