DETERMINATION OF TRACES OF SELENIUM IN HEAT-RESISTING ALLOYS BY GRAPHITE-FURNACE ATOMIC-ABSORPTION SPECTROMETRY AFTER CO-PRECIPITATION WITH ARSENIC

被引：16

作者：

KUJIRAI, O

KOBAYASHI, T

IDE, K

SUDO, E

机构：

来源：

TALANTA | 1983年 / 30卷 / 01期

关键词：

D O I：

10.1016/0039-9140(83)80004-6

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：9 / 14

页数：6

共 29 条

[1] A CHEMICAL CONCENTRATION X-RAY DETERMINATION OF SELENIUM IN COPPER- NICKEL- AND IRON-BASE ALLOYS [J].

ALBRIGHT, CH ;

BURKE, KE ;

YANAK, MM .

TALANTA, 1969, 16 (03) :309-&

[2] DETERMINATION OF SUBMICROGRAM AMOUNTS OF SELENIUM IN BIOLOGICAL MATERIALS [J].

ALLAWAY, WH ;

CARY, EE .

ANALYTICAL CHEMISTRY, 1964, 36 (07) :1359-&

[3] VOLATILIZATION OF ARSENIC(III, V), ANTIMONY(III, V), AND SELENIUM(IV, VI) FROM MIXTURES OF HYDROGEN-FLUORIDE AND PERCHLORIC-ACID SOLUTION - APPLICATION TO SILICATE ANALYSIS [J].

BAJO, S .

ANALYTICAL CHEMISTRY, 1978, 50 (04) :649-651

[4]

BOCK R, 1964, Z ANAL CHEM, V200, P81

[5] DETERMINATION OF TRACE IMPURITIES IN IRON AND NICKEL-BASE ALLOYS BY GRAPHITE FURNACE ATOMIC-ABSORPTION SPECTROMETRY [J].

DULSKI, TR ;

BIXLER, RR .

ANALYTICA CHIMICA ACTA, 1977, 91 (02) :199-209

[6]

Ediger R, 1975, AT ABSORPT NEWSLETT, V14, P127

[7] BACKGROUND CORRECTION IN ATOMIC-ABSORPTION UTILIZING THE ZEEMAN EFFECT [J].

FERNANDEZ, FJ ;

MYERS, SA ;

SLAVIN, W .

ANALYTICAL CHEMISTRY, 1980, 52 (04) :741-746

[8]

Fonzes-Diacon, 1900, CR HEBD ACAD SCI, V130, P832

[9]

HAMNER RM, 1976, ATOM ABSORPT NEWSL, V15, P122

[10] DETERMINATION OF SELENIUM IN WATER AND INDUSTRIAL EFFLUENTS BY FLAMELESS ATOMIC-ABSORPTION [J].

HENN, EL .

ANALYTICAL CHEMISTRY, 1975, 47 (03) :428-432

← 1 2 3 →