ANALYSIS OF OXYGEN ISOTOPE INTERFACES USING NEGATIVE MOLECULAR ION SIMS

[1] OXYGEN ISOTOPIC CONCENTRATION GRADIENT DETERMINATION WITH CAMECA ION MASS ANALYZER [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 416 - &

[2] DIFFUSION OF OXYGEN IN GROWING ZIRCONIA FILMS [J]. JOURNAL OF NUCLEAR MATERIALS, 1968, 28 (01) : 73 - &

[3] INFLUENCE OF OXIDE STRUCTURE ON OXIDATION RATE OF NICKEL SINGLE-CRYSTALS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (11) : 1523 - 1529

[4] DEPTH PROFILING BY SIMS DEPTH RESOLUTION, DYNAMIC-RANGE AND SENSITIVITY [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) : 35 - 41

[5] MEYER M, 1978, J MICROSC SPECT ELEC, V3, P477

[6] RHINES FN, 1975, STRESS EFFECTS OXIDA, P94

[7] USE OF SIMS TO INVESTIGATE INCORPORATION OF OXYGEN IN COO SCALES [J]. OXIDATION OF METALS, 1978, 12 (05): : 405 - 411

[8] OXYGEN TRACER STUDIES OF THE OXIDATION OF NIOBIUM [J]. OXIDATION OF METALS, 1981, 15 (3-4): : 215 - 229

[1] OXYGEN ISOTOPIC CONCENTRATION GRADIENT DETERMINATION WITH CAMECA ION MASS ANALYZER [J]. APPLIED PHYSICS LETTERS, 1968, 13 (12) : 416 - &

[2] DIFFUSION OF OXYGEN IN GROWING ZIRCONIA FILMS [J]. JOURNAL OF NUCLEAR MATERIALS, 1968, 28 (01) : 73 - &

[3] INFLUENCE OF OXIDE STRUCTURE ON OXIDATION RATE OF NICKEL SINGLE-CRYSTALS [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (11) : 1523 - 1529

[4] DEPTH PROFILING BY SIMS DEPTH RESOLUTION, DYNAMIC-RANGE AND SENSITIVITY [J]. SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) : 35 - 41

[5] MEYER M, 1978, J MICROSC SPECT ELEC, V3, P477

[6] RHINES FN, 1975, STRESS EFFECTS OXIDA, P94

[7] USE OF SIMS TO INVESTIGATE INCORPORATION OF OXYGEN IN COO SCALES [J]. OXIDATION OF METALS, 1978, 12 (05): : 405 - 411

[8] OXYGEN TRACER STUDIES OF THE OXIDATION OF NIOBIUM [J]. OXIDATION OF METALS, 1981, 15 (3-4): : 215 - 229