ALL HIGH-TC EDGE JUNCTIONS AND SQUIDS

被引：93

作者：

LAIBOWITZ, RB

KOCH, RH

GUPTA, A

KOREN, G

GALLAGHER, WJ

FOGLIETTI, V

OH, B

VIGGIANO, JM

机构：

[1] IBM Research Division, Yorktown Heights, NY 10598

来源：

APPLIED PHYSICS LETTERS | 1990年 / 56卷 / 07期

关键词：

D O I：

10.1063/1.102706

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We present the first observations of superconducting quantum interference in multilevel, all high Tc, lithographically patterned edge junction structures. The current-voltage characteristics are nonhysteretic and have well-defined critical currents. The dynamic resistance is independent of current above the critical current. These devices show periodic sensitivity to magnetic fields and low levels of magnetic hysteresis up to temperatures around 60 K.

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收藏

页码：686 / 688

页数：3

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