VARIATION OF YIELD OF ELECTRON-EMISSION FROM A SILICON SINGLE-CRYSTAL WITH DIFFRACTION CONDITION OF EXCITING X-RAYS

被引：26

作者：

KIKUTA, S ^{[1
]}

TAKAHASHI, T ^{[1
]}

TUZI, Y ^{[1
]}

机构：

[1] UNIV TOKYO,INST IND SCI,MINATO,TOKYO,JAPAN

来源：

PHYSICS LETTERS A | 1975年 / A 50卷 / 06期

关键词：

D O I：

10.1016/0375-9601(75)90123-1

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

收藏

页码：453 / 454

页数：2

相关论文

共 7 条

[1] INTENSITY ANOMALY OF FLUORESCENT X-RAY EMISSION ACCOMPANYING LAUE CASE REFLECTION FROM A PERFECT CRYSTAL
ANNAKA, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1967, 23 (02) : 372 - &
[2] INTENSITY ANOMALY OF X-RAY COMPTON AND THERMAL SCATTERINGS ACCOMPANYING BRAGG REFLECTIONS FROM PERFECT SI AND GE CRYSTALS
ANNAKA, S
KIKUTA, S
KOHRA, K
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1966, 21 (08) : 1559 - &
[3] DIRECTION DEPENDENCE OF INTENSITY ANOMALY OF X-RAY THERMAL SCATTERING ACCOMPANYING BRAGG CASE REFLECTION
ANNAKA, S
[J]. JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1968, 24 (06) : 1332 - &
[4] EFFECT OF DYNAMICAL DIFFRACTION IN X-RAY FLUORESCENCE SCATTERING
BATTERMAN, BW
[J]. PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 133 (3A): : A759 - &
[5] Laue MTF, 1960, RONTGENSTRAHL INTERF
[6] Shchemelev V. N., 1970, Fizika Tverdogo Tela, V12, P2495
[7] SHCHEMELEV VN, 1972, FIZ TVERD TELA+, V14, P3556