METHOD FOR MEASURING UNIFORMITY OF THIN TARGETS BY MEANS OF AN ALPHA SOURCE AND A Q3D-SPECTROGRAPH

被引：7

作者：

ABELE, HK

GLASSEL, P

MAIERKOMOR, P

SCHEERER, HJ

ROSLER, H

VONACH, H

机构：

[1] TECH UNIV MUNICH,D-8046 GARCHING,FED REP GER

[2] UNIV MUNICH,D-8000 MUNICH 2,FED REP GER

[3] OSTERREICH AKAD WISSENSCH,INST RADIUM FORSCH & KERNPHYS,VIENNA,AUSTRIA

来源：

NUCLEAR INSTRUMENTS & METHODS | 1976年 / 137卷 / 01期

关键词：

D O I：

10.1016/0029-554X(76)90262-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：157 / 167

页数：11

共 14 条

[1] TARGET THICKNESS AND UNIFORMITY MEASUREMENTS USING CHARGED-PARTICLES [J].

ADAIR, HL .

NUCLEAR INSTRUMENTS & METHODS, 1972, 102 (03) :599-&

[2] ZUM ENERGIEVERLUST ENERGIEREICHER ELEKTRONEN IN DUNNEN SCHICHTEN [J].

BLUNCK, O ;

WESTPHAL, K .

ZEITSCHRIFT FUR PHYSIK, 1951, 130 (05) :641-649

[3] ZUM ENERGIEVERLUST SCHNELLER ELEKTRONEN IN DUNNEN SCHICHTEN [J].

BLUNCK, O ;

LEISEGANG, S .

ZEITSCHRIFT FUR PHYSIK, 1950, 128 (04) :500-505

[4] STUDY OF VARIOUS PARTING AGENTS FOR PRODUCING SELF-SUPPORTING THIN-FILMS [J].

BRASKI, DN .

NUCLEAR INSTRUMENTS & METHODS, 1972, 102 (03) :553-&

[5]

GLASSEL P, 1974, THESIS U MUNCHEN

[6]

Loebner K.E, 1970, ATOM DATA NUCL DATA, V7, P495

[7] ION OPTICAL PROPERTIES OF MUNICH Q3D-SPECTROGRAPH INVESTIGATED BY MEANS OF A SPECIAL EXPERIMENTAL RAY TRACING METHOD [J].

LOFFLER, M ;

SCHEERER, HJ ;

VONACH, H .

NUCLEAR INSTRUMENTS & METHODS, 1973, 111 (01) :1-12

[8]

MACCABEE HD, 1962, PHYS REV, V165, P469

[9] SIMPLE TECHNIQUE OF PRODUCING THIN CARBON-FILMS [J].

MAIERKOM.P .

NUCLEAR INSTRUMENTS & METHODS, 1972, 102 (03) :485-&

[10]

MANNER R, 1974, THESIS U MUNCHEN

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