X-RAY-FLUORESCENCE SPECTROMETRY WITH SYNCHROTRON RADIATION

被引:24
作者
KNOCHEL, A
PETERSEN, W
TOLKIEHN, G
机构
关键词
D O I
10.1016/S0003-2670(00)84948-X
中图分类号
O65 [分析化学];
学科分类号
070302 ; 081704 ;
摘要
引用
收藏
页码:105 / 116
页数:12
相关论文
共 20 条
[1]   MULTI-ELEMENT THIN-FILM STANDARDS FOR XRF ANALYSIS [J].
BILLIET, J ;
DAMS, R ;
HOSTE, J .
X-RAY SPECTROMETRY, 1980, 9 (04) :206-211
[2]   ENERGY-DISPERSIVE XRF SPECTROMETRY USING SECONDARY RADIATION IN A CARTESIAN GEOMETRY [J].
BISGARD, KM ;
LAURSEN, J ;
NIELSEN, BS .
X-RAY SPECTROMETRY, 1981, 10 (01) :17-24
[3]   EXPERIMENTAL COMPARISON OF SYNCHROTRON RADIATION WITH OTHER MODES OF EXCITATION OF X-RAYS FOR TRACE-ELEMENT ANALYSIS [J].
BOS, AJJ ;
VIS, RD ;
VERHEUL, H ;
PRINS, M ;
DAVIES, ST ;
BOWEN, DK ;
MAKJANIC, J ;
VALKOVIC, V .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1984, 3 (1-3) :232-240
[4]  
BRESCHINSKY R, 1979, THESIS U BREMEN
[6]   BACKGROUND REDUCTION IN X-RAY-FLUORESCENCE SPECTRA USING POLARIZATION [J].
DZUBAY, TG ;
JARRETT, BV ;
JAKLEVIC, JM .
NUCLEAR INSTRUMENTS & METHODS, 1974, 115 (01) :297-299
[7]   SYNCHROTRON RADIATION X-RAY-FLUORESCENCE ANALYSIS [J].
GILFRICH, JV ;
SKELTON, EF ;
QADRI, SB ;
KIRKLAND, JP ;
NAGEL, DJ .
ANALYTICAL CHEMISTRY, 1983, 55 (02) :187-190
[8]   SCANNING X-RAY MICROSCOPE USING SYNCHROTRON RADIATION [J].
HOROWITZ, P .
SCIENCE, 1972, 178 (4061) :608-&
[9]  
HOWELL R, 1975, ADV XRAY ANAL, V18, P265
[10]   ANALYTICAL APPLICATION OF PARTICLE INDUCED X-RAY-EMISSION [J].
JOHANSSON, SAE ;
JOHANSSON, TB .
NUCLEAR INSTRUMENTS & METHODS, 1976, 137 (03) :473-516