SURFACE ELECTRONIC-PROPERTIES PROBED WITH TUNNELLING MICROSCOPY AND CHEMICAL DOPING

被引：34

作者：

WU, XL ^{[1
]}

ZHOU, P ^{[1
]}

LIEBER, CM ^{[1
]}

机构：

[1] COLUMBIA UNIV,DEPT CHEM,NEW YORK,NY 10027

来源：

NATURE | 1988年 / 335卷 / 6185期

关键词：

D O I：

10.1038/335055a0

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：55 / 57

页数：3

共 17 条

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