DEVICE FOR SIMULTANEOUSLY MEASURING STRESS, STRAIN, AND RESISTANCE IN WHISKERLIKE MATERIALS IN THE TEMPERATURE-RANGE 1.5-K-LESS-THAN-T-LESS-THAN-360-K

被引：15

作者：

SKOVE, MJ ^{[1
]}

TRITT, TM ^{[1
]}

EHRLICH, AC ^{[1
]}

DAVIS, HS ^{[1
]}

机构：

[1] CLEMSON UNIV,DEPT PHYS,CLEMSON,SC 29634

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1991年 / 62卷 / 04期

关键词：

D O I：

10.1063/1.1142050

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We describe a device for measuring Young's modulus Y and the piezoresistance of "whiskerlike" samples. The device can be used in a standard vari-temp Dewar in the temperature range 1.5 K < T < 360 K. One end of the sample is attached to a movable rod suspended by leaf springs and the other end is held fixed. Force is applied to the rod by a coaxial electromagnet acting on permanent magnets attached to the rod. Displacements are measured with a capacitive technique. We have used the device to measure Young's modulus for the charge density wave material TaS3. We also measured the Young's modulus of some Cu whiskers for comparison.

引用

页码：1010 / 1014

页数：5

共 39 条

[1] GROWTH, STRUCTURE, AND PROPERTIES OF GRAPHITE WHISKERS [J].