CONTRAST AND RESOLUTION OF SMALL DISLOCATION LOOPS IN HIGH-VOLTAGE ELECTRON-MICROSCOPY

被引：4

作者：

CHEN, LJ

SESHAN, K

THOMAS, G

机构：

[1] UNIV CALIF,DEPT MAT SCI & ENGN,BERKELEY,CA

[2] UNIV CALIF,DEPT PHYS,BERKELEY,CA

[3] LAWRENCE BERKELEY LAB,INORG MAT RES DIV,BERKELEY,CA

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1975年 / 28卷 / 01期

关键词：

D O I：

10.1002/pssa.2210280136

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：309 / 319

页数：11

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[9] INVESTIGATIONS OF IMAGES OF A SUPERDISLOCATION AND A DISLOCATION DIPOLE USING SYSTEMATIC REFLECTIONS [J].

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