THE MEASUREMENT OF KIC IN SINGLE-CRYSTAL SIC USING THE INDENTATION METHOD

被引:29
作者
HENSHALL, JL
BROOKES, CA
机构
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D O I
10.1007/BF00726990
中图分类号
T [工业技术];
学科分类号
08 ;
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页码:783 / 786
页数:4
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