PROBLEMS ASSOCIATED WITH THE MEASUREMENT OF X-RAY ATTENUATION COEFFICIENTS - SILICON - REPORT ON THE INTERNATIONAL-UNION-OF-CRYSTALLOGRAPHY-X-RAY-ATTENUATION-PROJECT

被引：157

作者：

CREAGH, DC

HUBBELL, JH

机构：

[1] NBS,CTR RADIAT RES,GAITHERSBURG,MD 20899

[2] ROYAL MIL COLL,DEPT PHYS,DUNTROON,ACT 2600,AUSTRALIA

来源：

ACTA CRYSTALLOGRAPHICA SECTION A | 1987年 / 43卷

关键词：

D O I：

10.1107/S0108767387099793

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：102 / 112

页数：11

共 54 条

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[7] REEVALUATION OF X-RAY ATOMIC ENERGY LEVELS [J].

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