SMOOTHING AND DIFFERENTIATION OF TWO-DIMENSIONAL DATA

被引：2

作者：

STAMPFL, A ^{[1
]}

RILEY, JD ^{[1
]}

LECKEY, R ^{[1
]}

机构：

[1] LA TROBE UNIV,ELECTRON MICROSCOPY RES CTR,BUNDOORA,VIC 3083,AUSTRALIA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 16卷 / 4-5期

关键词：

D O I：

10.1016/0168-583X(86)90109-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：427 / 433

页数：7

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[9] POSITION-SENSITIVE DETECTOR SYSTEM FOR ANGLE-RESOLVED ELECTRON-SPECTROSCOPY WITH A CYLINDRICAL MIRROR ANALYZER [J].

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