NEAR-SURFACE ANALYSIS AND DEPTH PROFILING BY FT-IR PHOTOACOUSTIC-SPECTROSCOPY

被引：43

作者：

YANG, CQ

BRESEE, RR

FATELEY, WG

机构：

[1] KANSAS STATE UNIV AGR & APPL SCI,DEPT CHEM,MANHATTAN,KS 66506

[2] KANSAS STATE UNIV AGR & APPL SCI,DEPT CLOTHING TEXT & INTERIOR DESIGN,MANHATTAN,KS 66506

来源：

关键词：

D O I：

10.1366/0003702874448319

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：889 / 896

页数：8

共 21 条

[1]

BERNI RJ, 1985, ANAL METHODS TEXTILE, P267

[2]

DOHINI JC, 1984, INFRARED PHYS, V24, P157

[3]

GERSON DJ, 1984, AM LAB NOV, P69

[4]

GERSON DJ, 1984, AM LAB NOV, P63

[5]

Graham J. A., 1985, FOURIER TRANSFORM IN, V4, P345

[6]

Kirkbright G. F., 1978, Optica Pura y Aplicada, V11, P125

KRISHNAN, K .

[8]

MCCALL ER, 1967, AM DYEST REP, V56, P13

[9]

MCCLELLAND JF, 1983, ANAL CHEM, V55, pA89, DOI 10.1021/ac00252a003

OCONNOR, RT ;

DUPRE, EF ;

MCCALL, ER .