X-RAY AND ELECTRON-MICROSCOPY STUDIES OF SINGLE-LAYER TAS2 AND NBS2

被引：42

作者：

LIU, C ^{[1
]}

SINGH, O ^{[1
]}

JOENSEN, P ^{[1
]}

CURZON, AE ^{[1
]}

FRINDT, RF ^{[1
]}

机构：

[1] SIMON FRASER UNIV,DEPT PHYS,BURNABY V5A 1S6,BC,CANADA

来源：

关键词：

D O I：

10.1016/0040-6090(84)90025-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：165 / 172

页数：8

共 7 条

[1] THE ATTAINMENT OF A SUBSTRATE-TEMPERATURE OF 25-K IN A PHILIPS EM 300 ELECTRON-MICROSCOPE
CURZON, AE
SCHOLZ, GA
SINGH, O
FRINDT, RF
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1982, 15 (06): : 629 - 631
[2] KLUG HP, 1954, XRAY DIFFRACTION PRO, P524
[3] MURPHY DW, 1975, J CHEM PHYS, V62, P173
[4] LOCALIZATION IN THE METALLIC REGIME OF GRANULAR CU-SIO2 FILMS
SAVVIDES, N
MCALISTER, SP
HURD, CM
SHIOZAKI, I
[J]. SOLID STATE COMMUNICATIONS, 1982, 42 (02) : 143 - 145
[5] PHASE-TRANSITION IN 2H-TAS2 AT 75K
TIDMAN, JP
SINGH, O
CURZON, AE
FRINDT, RF
[J]. PHILOSOPHICAL MAGAZINE, 1974, 30 (05): : 1191 - 1194
[6] VONKLITZING K, 1980, PHYS REV LETT, V45, P494, DOI 10.1103/PhysRevLett.45.494
[7] X-ray diffraction in random layer lattices
Warren, BE
[J]. PHYSICAL REVIEW, 1941, 59 (09): : 693 - 698