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SILICON SELF-INTERSTITIAL SUPERSATURATION DURING PHOSPHORUS DIFFUSION
被引:39
作者
:
HARRIS, RM
论文数:
0
引用数:
0
h-index:
0
HARRIS, RM
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
ANTONIADIS, DA
机构
:
来源
:
APPLIED PHYSICS LETTERS
|
1983年
/ 43卷
/ 10期
关键词
:
D O I
:
10.1063/1.94187
中图分类号
:
O59 [应用物理学];
学科分类号
:
摘要
:
引用
收藏
页码:937 / 939
页数:3
相关论文
共 13 条
[1]
DIFFUSION OF SUBSTITUTIONAL IMPURITIES IN SILICON AT SHORT OXIDATION TIMES - AN INSIGHT INTO POINT-DEFECT KINETICS
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
ANTONIADIS, DA
;
MOSKOWITZ, I
论文数:
0
引用数:
0
h-index:
0
MOSKOWITZ, I
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(10)
:6788
-6796
[2]
OXIDATION-INDUCED POINT-DEFECTS IN SILICON
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
ANTONIADIS, DA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
:1093
-1097
[3]
MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
:412
-422
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
[J].
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
;
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
.
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
:3770
-&
[5]
THERMAL-OXIDATION KINETICS OF SILICON IN PYROGENIC H2O AND 5-PERCENT HCL-H2O MIXTURES
[J].
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(04)
:576
-579
[6]
QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS INC,READING,PA 19604
BELL LABS INC,READING,PA 19604
FAIR, RB
;
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS INC,READING,PA 19604
BELL LABS INC,READING,PA 19604
TSAI, JCC
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(07)
:1107
-1118
[7]
LOCALIZED ENHANCED DIFFUSION IN NPN SILICON TRANSISTORS - (EMITTER DIP EFFECT VACANCY MODEL X-RAY MICROSCOPY E/T)
[J].
GERETH, R
论文数:
0
引用数:
0
h-index:
0
GERETH, R
;
SCHWUTTKE, GH
论文数:
0
引用数:
0
h-index:
0
SCHWUTTKE, GH
.
APPLIED PHYSICS LETTERS,
1966,
8
(03)
:55
-+
[8]
LEE DB, 1974, PHILIPS RES REP S, V5
[9]
THE GROWTH OF OXIDATION STACKING-FAULTS AND THE POINT-DEFECT GENERATION AT SI-SIO INTERFACE DURING THERMAL-OXIDATION OF SILICON
[J].
LIN, AM
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
LIN, AM
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
;
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
;
TILLER, WA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
TILLER, WA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(05)
:1121
-1130
[10]
RETARDATION OF SB DIFFUSION IN SI DURING THERMAL-OXIDATION
[J].
MIZUO, S
论文数:
0
引用数:
0
h-index:
0
MIZUO, S
;
HIGUCHI, H
论文数:
0
引用数:
0
h-index:
0
HIGUCHI, H
.
JAPANESE JOURNAL OF APPLIED PHYSICS,
1981,
20
(04)
:739
-744
←
1
2
→
共 13 条
[1]
DIFFUSION OF SUBSTITUTIONAL IMPURITIES IN SILICON AT SHORT OXIDATION TIMES - AN INSIGHT INTO POINT-DEFECT KINETICS
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
ANTONIADIS, DA
;
MOSKOWITZ, I
论文数:
0
引用数:
0
h-index:
0
MOSKOWITZ, I
.
JOURNAL OF APPLIED PHYSICS,
1982,
53
(10)
:6788
-6796
[2]
OXIDATION-INDUCED POINT-DEFECTS IN SILICON
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
ANTONIADIS, DA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1982,
129
(05)
:1093
-1097
[3]
MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS
[J].
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
.
IEEE JOURNAL OF SOLID-STATE CIRCUITS,
1979,
14
(02)
:412
-422
[4]
GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON
[J].
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
;
GROVE, AS
论文数:
0
引用数:
0
h-index:
0
GROVE, AS
.
JOURNAL OF APPLIED PHYSICS,
1965,
36
(12)
:3770
-&
[5]
THERMAL-OXIDATION KINETICS OF SILICON IN PYROGENIC H2O AND 5-PERCENT HCL-H2O MIXTURES
[J].
DEAL, BE
论文数:
0
引用数:
0
h-index:
0
DEAL, BE
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1978,
125
(04)
:576
-579
[6]
QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT
[J].
FAIR, RB
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS INC,READING,PA 19604
BELL LABS INC,READING,PA 19604
FAIR, RB
;
TSAI, JCC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL LABS INC,READING,PA 19604
BELL LABS INC,READING,PA 19604
TSAI, JCC
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1977,
124
(07)
:1107
-1118
[7]
LOCALIZED ENHANCED DIFFUSION IN NPN SILICON TRANSISTORS - (EMITTER DIP EFFECT VACANCY MODEL X-RAY MICROSCOPY E/T)
[J].
GERETH, R
论文数:
0
引用数:
0
h-index:
0
GERETH, R
;
SCHWUTTKE, GH
论文数:
0
引用数:
0
h-index:
0
SCHWUTTKE, GH
.
APPLIED PHYSICS LETTERS,
1966,
8
(03)
:55
-+
[8]
LEE DB, 1974, PHILIPS RES REP S, V5
[9]
THE GROWTH OF OXIDATION STACKING-FAULTS AND THE POINT-DEFECT GENERATION AT SI-SIO INTERFACE DURING THERMAL-OXIDATION OF SILICON
[J].
LIN, AM
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
LIN, AM
;
DUTTON, RW
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
DUTTON, RW
;
ANTONIADIS, DA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
ANTONIADIS, DA
;
TILLER, WA
论文数:
0
引用数:
0
h-index:
0
机构:
STANFORD UNIV,INTEGRATED CIRCUITS LAB,STANFORD,CA 94305
TILLER, WA
.
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1981,
128
(05)
:1121
-1130
[10]
RETARDATION OF SB DIFFUSION IN SI DURING THERMAL-OXIDATION
[J].
MIZUO, S
论文数:
0
引用数:
0
h-index:
0
MIZUO, S
;
HIGUCHI, H
论文数:
0
引用数:
0
h-index:
0
HIGUCHI, H
.
JAPANESE JOURNAL OF APPLIED PHYSICS,
1981,
20
(04)
:739
-744
←
1
2
→