SILICON SELF-INTERSTITIAL SUPERSATURATION DURING PHOSPHORUS DIFFUSION

被引:39
作者
HARRIS, RM
ANTONIADIS, DA
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D O I
10.1063/1.94187
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O59 [应用物理学];
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页码:937 / 939
页数:3
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共 13 条
[1]   DIFFUSION OF SUBSTITUTIONAL IMPURITIES IN SILICON AT SHORT OXIDATION TIMES - AN INSIGHT INTO POINT-DEFECT KINETICS [J].
ANTONIADIS, DA ;
MOSKOWITZ, I .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (10) :6788-6796
[2]   OXIDATION-INDUCED POINT-DEFECTS IN SILICON [J].
ANTONIADIS, DA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (05) :1093-1097
[3]   MODELS FOR COMPUTER-SIMULATION OF COMPLETE IC FABRICATION PROCESS [J].
ANTONIADIS, DA ;
DUTTON, RW .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1979, 14 (02) :412-422
[4]   GENERAL RELATIONSHIP FOR THERMAL OXIDATION OF SILICON [J].
DEAL, BE ;
GROVE, AS .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3770-&
[6]   QUANTITATIVE MODEL FOR DIFFUSION OF PHOSPHORUS IN SILICON AND EMITTER DIP EFFECT [J].
FAIR, RB ;
TSAI, JCC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1977, 124 (07) :1107-1118
[7]   LOCALIZED ENHANCED DIFFUSION IN NPN SILICON TRANSISTORS - (EMITTER DIP EFFECT VACANCY MODEL X-RAY MICROSCOPY E/T) [J].
GERETH, R ;
SCHWUTTKE, GH .
APPLIED PHYSICS LETTERS, 1966, 8 (03) :55-+
[8]  
LEE DB, 1974, PHILIPS RES REP S, V5
[9]   THE GROWTH OF OXIDATION STACKING-FAULTS AND THE POINT-DEFECT GENERATION AT SI-SIO INTERFACE DURING THERMAL-OXIDATION OF SILICON [J].
LIN, AM ;
DUTTON, RW ;
ANTONIADIS, DA ;
TILLER, WA .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1981, 128 (05) :1121-1130
[10]   RETARDATION OF SB DIFFUSION IN SI DURING THERMAL-OXIDATION [J].
MIZUO, S ;
HIGUCHI, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1981, 20 (04) :739-744