ZONE-AXIS PATTERNS IN REFLECTION HIGH-ENERGY ELECTRON-DIFFRACTION - A FAMILY OF NEW TECHNIQUES FOR SURFACE CHARACTERIZATION

被引：21

作者：

SHANNON, MD ^{[1
]}

EADES, JA ^{[1
]}

MEICHLE, ME ^{[1
]}

TURNER, PS ^{[1
]}

机构：

[1] GRIFFITH UNIV,SCH SCI,NATHAN,QLD 4111,AUSTRALIA

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

SURFACES - Microscopic Examination;

D O I：

10.1016/0304-3991(85)90072-5

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The authors present a family of techniques for the transmission electron microscope that generate surface zone-axis patterns. These patterns display the variation of the diffracted-beam intensity as a function of the angle of the incident electrons. Experimental results are presented for diffraction from surfaces of MgO and MoS//2. We anticipate that surface zone-axis patterns (surface ZAPs) will become established as an important tool for surface characterization, especially when used in conjunction with high-resolution surface imaging and surface energy loss spectroscopy; surface ZAPs may be expected to play, in surface analysis, a role analogous to that played by convergent-beam diffraction in normal transmission electron microscopy.

引用

页码：175 / 192

页数：18

共 26 条

[1] ELECTRON MICRO-DIFFRACTION STUDIES OF THE POTENTIAL-FIELD AT CRYSTAL-SURFACES [J].