OBSERVATION OF METALLIC ADHESION USING THE SCANNING TUNNELING MICROSCOPE

被引:149
作者
DURIG, U
ZUGER, O
POHL, DW
机构
[1] IBM Research Division, Zurich Research Laboratory
关键词
D O I
10.1103/PhysRevLett.65.349
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The interaction between an Ir tip and an Ir sample was investigated during normal tunneling operation of the scanning tunneling microscope. Force gradients compatible with metallic adhesion were observed within a range of 2 before making contact. Based on the theory of metallic adhesion, a scaling relation is derived which allows the tip geometry and the characteristics of the interaction to be accounted for in a systematic manner. © 1990 The American Physical Society.
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页码:349 / 352
页数:4
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