STOCHASTIC MODELING OF ELECTRICAL TREEING - FRACTAL AND STATISTICAL CHARACTERISTICS

A two-dimensional stochastic model of electrical treeing in solid dielectrics has been examined using ’fractal ’ analysis and statistical methods. It is found that simulated trees display remarkably similar behaviour to that found experimentally. A distribution of dimensions is found and simulated failure probability is well described by the two-parameter Weibull distribution. Several methods of assessing fractal dimension are critically compared and correlations are found between different methods. The influence of model parameters on tree growth behaviour is also examined. © 1990 IOP Publishing Ltd.