DETECTION OF [SI II] (34.8 MICRON) EMISSION IN ORION-KL - A MEASUREMENT OF THE SILICON ABUNDANCE IN DENSE INTERSTELLAR GAS

被引：45

作者：

HAAS, MR ^{[1
]}

HOLLENBACH, DJ ^{[1
]}

ERICKSON, EF ^{[1
]}

机构：

[1] MYCOL INC,SUNNYVALE,CA

来源：

ASTROPHYSICAL JOURNAL | 1986年 / 301卷 / 02期

关键词：

D O I：

10.1086/184623

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

引用

页码：L57 / L60

页数：4

共 32 条

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