APPLICATION OF KOHONEN AND SUPERVISED FORCED ORGANIZATION MAPS TO FAULT-DIAGNOSIS IN CMOS OPAMPS

被引：11

作者：

COLLINS, P ^{[1
]}

YU, S ^{[1
]}

ECKERSALL, KR ^{[1
]}

JERVIS, BW ^{[1
]}

BELL, IM ^{[1
]}

TAYLOR, GE ^{[1
]}

机构：

[1] UNIV HULL,SCH ENGN & COMP,VLSI DESIGN & TEST GRP,KINGSTON HULL HU6 7RX,N HUMBERSIDE,ENGLAND

来源：

ELECTRONICS LETTERS | 1994年 / 30卷 / 22期

关键词：

SELF-ORGANIZING FEATURE MAPS; FAULT LOCATION; CMOS INTEGRATED CIRCUITS; OPERATIONAL AMPLIFIERS;

D O I：

10.1049/el:19941281

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined.

引用

页码：1846 / 1847

页数：2