PRECURSOR FOR THE LOW-TEMPERATURE DEPOSITION OF TITANIUM PHOSPHIDE FILMS

被引:31
作者
LEWKEBANDARA, TS [1 ]
PROSCIA, JW [1 ]
WINTER, CH [1 ]
机构
[1] FORD MOTOR CO,DIV GLASS,DEARBORN,MI 48120
关键词
D O I
10.1021/cm00054a003
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Treatment of titanium tetrachloride with cyclohexylphosphine (2 equiv) affords the volatile adduct [TiCl4(C6H11PH2)(2)], which constitutes the first single-source precursor to titanium phosphide (TiP films). In addition, this precursor deposits films at much lower temperatures than is possible with existing processes. Films prepared using [TiCl4(C6H11PH2)(2)] at greater than or equal to 350 degrees C under low-pressure chemical vapor deposition conditions were slightly phosphorus-rich by RES analysis and revealed less than or equal to 2% carbon or chlorine impurities. The resistivities of films made at 400 and 600 degrees C were 286 and 421 mu Omega cm, respectively. The major volatile byproducts of the depositions were phosphine, hydrogen chloride, and cyclohexene. [TiCl4(C6H11PH2)2] --> CVD reactor, greater than or equal to 350 degrees C Tip films (1)
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页码:1053 / 1054
页数:2
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