CRYSTALLOGRAPHIC DETERMINATION OF METAL-SURFACES WITH HELIUM SCATTERING

被引：23

作者：

GARCIA, N ^{[1
]}

BARKER, JA ^{[1
]}

BATRA, IP ^{[1
]}

机构：

[1] IBM CORP,RES LAB,SAN JOSE,CA 95193

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1983年 / 30卷 / FEB期

关键词：

D O I：

10.1016/0368-2048(83)85045-2

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：137 / 144

页数：8

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