DIRECT IMAGING OF A NOVEL SILICON SURFACE RECONSTRUCTION

[1] COWLEY JM, 1981, DIFFRACTION PHYSICS

[2] UNIQUENESS OF SURFACE IMAGES [J]. PHYSICAL REVIEW LETTERS, 1984, 53 (19) : 1859 - 1859

[3] ISHIZAKA A, 1982, UNPUB 2ND P INT S TO, P183

[4] KRIVANEK OL, 1985, 43RD P ANN EMSA M LO, P262

[5] DIRECT IMAGING OF CARBON-COVERED AND CLEAN GOLD (110) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (11) : 1000 - 1002

[6] SURFACE DISLOCATION PROCESS FOR SURFACE RECONSTRUCTION AND ITS APPLICATION TO THE SILICON (111) 7X7 RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (03) : 199 - 202

[7] [113] LOOPS IN ELECTRON-IRRADIATED SILICON [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (03): : 317 - 323

[8] STRUCTURE AND ADSORPTION CHARACTERISTICS OF CLEAN SURFACES OF GERMANIUM AND SILICON [J]. JOURNAL OF CHEMICAL PHYSICS, 1959, 30 (04) : 917 - 926

[9] HIGH-ENERGY TRANSMISSION ELECTRON-DIFFRACTION AND IMAGING STUDIES OF THE SILICON(111) 7X7 SURFACE-STRUCTURE [J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 117 - 124

[10] STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1502 - 1506

[1] COWLEY JM, 1981, DIFFRACTION PHYSICS

[2] UNIQUENESS OF SURFACE IMAGES [J]. PHYSICAL REVIEW LETTERS, 1984, 53 (19) : 1859 - 1859

[3] ISHIZAKA A, 1982, UNPUB 2ND P INT S TO, P183

[4] KRIVANEK OL, 1985, 43RD P ANN EMSA M LO, P262

[5] DIRECT IMAGING OF CARBON-COVERED AND CLEAN GOLD (110) SURFACES [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (11) : 1000 - 1002

[6] SURFACE DISLOCATION PROCESS FOR SURFACE RECONSTRUCTION AND ITS APPLICATION TO THE SILICON (111) 7X7 RECONSTRUCTION [J]. PHYSICAL REVIEW LETTERS, 1983, 51 (03) : 199 - 202

[7] [113] LOOPS IN ELECTRON-IRRADIATED SILICON [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (03): : 317 - 323

[8] STRUCTURE AND ADSORPTION CHARACTERISTICS OF CLEAN SURFACES OF GERMANIUM AND SILICON [J]. JOURNAL OF CHEMICAL PHYSICS, 1959, 30 (04) : 917 - 926

[9] HIGH-ENERGY TRANSMISSION ELECTRON-DIFFRACTION AND IMAGING STUDIES OF THE SILICON(111) 7X7 SURFACE-STRUCTURE [J]. ULTRAMICROSCOPY, 1983, 11 (2-3) : 117 - 124

[10] STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1502 - 1506