CHARACTERIZATION OF PT MICROCRYSTALS USING HIGH-RESOLUTION ELECTRON-MICROSCOPY

被引：25

作者：

LONG, NJ

MARZKE, RF

MCKELVY, M

GLAUNSINGER, WS

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

[2] ARIZONA STATE UNIV,DEPT CHEM,TEMPE,AZ 85287

来源：

ULTRAMICROSCOPY | 1986年 / 20卷 / 1-2期

关键词：

D O I：

10.1016/0304-3991(86)90162-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：15 / 20

页数：6

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