ATOMIC TRANSPORT VIA POINT-DEFECTS IN CRYSTALS .4. ANELASTIC RELAXATION

被引：2

作者：

LIDIARD, AB

机构：

来源：

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES | 1986年 / 406卷 / 1830期

关键词：

D O I：

10.1098/rspa.1986.0067

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

引用

页码：107 / 113

页数：7

共 15 条

[1] CLUSTERING IN RARE-EARTH-DOPED ALKALINE-EARTH FLUORIDES [J].

ANDEEN, CG ;

FONTANELLA, JJ ;

WINTERSGILL, MC ;

WELCHER, PJ ;

KIMBLE, RJ ;

MATTHEWS, GE .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (24) :3557-3574

[2] ANELASTIC + DIELECTRIC RELAXATION DUE TO IMPURITY-VACANCY COMPLEXES IN NACL CRYSTALS [J].

DREYFUS, RW ;

LAIBOWIT.RB .

PHYSICAL REVIEW A-GENERAL PHYSICS, 1964, 135 (5A) :1413-&

[3] POINT-DEFECT ACTIVATION VOLUMES IN THE ALKALINE-EARTH FLUORIDES [J].

FONTANELLA, JJ ;

WINTERSGILL, MC ;

CHADWICK, AV ;

SAGHAFIAN, R ;

ANDEEN, CG .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1981, 14 (18) :2451-2464

[4] ATOMIC TRANSPORT VIA POINT-DEFECTS IN CRYSTALS .2. ATOMIC MOBILITIES AND DIELECTRIC-RELAXATION [J].

FRANKLIN, AD ;

LIDIARD, AB .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1984, 392 (1803) :457-473

[5] ATOMIC TRANSPORT VIA POINT-DEFECTS IN CRYSTALS .1. GENERAL KINETIC-THEORY OF DIFFUSION [J].

FRANKLIN, AD ;

LIDIARD, AB .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1983, 389 (1797) :405-431

[6]

HAVEN Y, 1958, NUOVO CIMENTO S, V7, P605

[7] ATOMIC TRANSPORT VIA POINT-DEFECTS IN CRYSTALS .3. MIGRATION IN A STRESS-FIELD [J].

LIDIARD, AB .

PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1985, 398 (1814) :203-208

[8]

LIDIARD AB, 1983, MASS TRANSPORT SOLID, P43

[9]

LIDIARD AB, 1984, AERE R11367 REP

[10] STUDY OF DEFECT REACTIONS IN CRYSTALS BY MEANS OF ANELASTIC AND DIELECTRIC RELAXATION [J].

NOWICK, AS .

JOURNAL OF CHEMICAL PHYSICS, 1970, 53 (05) :2066-+

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