PROTEIN CRYSTALLOGRAPHY WITH SYNCHROTRON RADIATION

[1] CRYSTAL-STRUCTURE OF ELASTASE-SUBSTRATE COMPLEX AT -55DEGREESC [J]. NATURE, 1976, 263 (5575) : 297 - 300

[2] OPTIMIZED ANOMALOUS DISPERSION IN CRYSTALLOGRAPHY - A SYNCHROTRON X-RAY POLYCHROMATIC SIMULTANEOUS PROFILE METHOD [J]. NATURE, 1982, 298 (5877) : 835 - 838

[3] STRUCTURE-ANALYSIS OF A CAF2 SINGLE-CRYSTAL WITH AN EDGE LENGTH OF ONLY 6 MU-M - AN EXPERIMENT USING SYNCHROTRON RADIATION [J]. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH, 1983, 22 (12): : 1011 - 1012

[4] EALICK S, 1984, 13TH IUCR C HAMB

[5] EINSPAHR H, 1983, ACA M SNOWMASS

[6] EINSPAHR H, 1985, ACTA CRYSTALLOGR

[7] SYNCHROTRON X-RAY-DIFFRACTION FROM A 800 MU-M ZEOLITE MICROCRYSTAL [J]. NATURE, 1984, 309 (5963) : 45 - 47

[8] GREENHOUGH TJ, 1982, J APPL CRYSTALLOGR, V15, P493, DOI 10.1107/S0021889882012485

[9] OSCILLATION CAMERA DATA-PROCESSING - REFLECTING RANGE AND PREDICTION OF PARTIALITY .1. CONVENTIONAL X-RAY SOURCES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 338 - 351

[10] OSCILLATION CAMERA DATA-PROCESSING .3. GENERAL DIFFRACTION SPOT SIZE, SHAPE AND ENERGY PROFILE - FORMALISM FOR POLYCHROMATIC DIFFRACTION EXPERIMENTS WITH MONOCHROMATIZED SYNCHROTRON X-RADIATION FROM A SINGLY BENT TRIANGULAR MONOCHROMATOR [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 242 - 250

[1] CRYSTAL-STRUCTURE OF ELASTASE-SUBSTRATE COMPLEX AT -55DEGREESC [J]. NATURE, 1976, 263 (5575) : 297 - 300

[2] OPTIMIZED ANOMALOUS DISPERSION IN CRYSTALLOGRAPHY - A SYNCHROTRON X-RAY POLYCHROMATIC SIMULTANEOUS PROFILE METHOD [J]. NATURE, 1982, 298 (5877) : 835 - 838

[3] STRUCTURE-ANALYSIS OF A CAF2 SINGLE-CRYSTAL WITH AN EDGE LENGTH OF ONLY 6 MU-M - AN EXPERIMENT USING SYNCHROTRON RADIATION [J]. ANGEWANDTE CHEMIE-INTERNATIONAL EDITION IN ENGLISH, 1983, 22 (12): : 1011 - 1012

[4] EALICK S, 1984, 13TH IUCR C HAMB

[5] EINSPAHR H, 1983, ACA M SNOWMASS

[6] EINSPAHR H, 1985, ACTA CRYSTALLOGR

[7] SYNCHROTRON X-RAY-DIFFRACTION FROM A 800 MU-M ZEOLITE MICROCRYSTAL [J]. NATURE, 1984, 309 (5963) : 45 - 47

[8] GREENHOUGH TJ, 1982, J APPL CRYSTALLOGR, V15, P493, DOI 10.1107/S0021889882012485

[9] OSCILLATION CAMERA DATA-PROCESSING - REFLECTING RANGE AND PREDICTION OF PARTIALITY .1. CONVENTIONAL X-RAY SOURCES [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1982, 15 (JUN) : 338 - 351

[10] OSCILLATION CAMERA DATA-PROCESSING .3. GENERAL DIFFRACTION SPOT SIZE, SHAPE AND ENERGY PROFILE - FORMALISM FOR POLYCHROMATIC DIFFRACTION EXPERIMENTS WITH MONOCHROMATIZED SYNCHROTRON X-RADIATION FROM A SINGLY BENT TRIANGULAR MONOCHROMATOR [J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1983, 16 (APR) : 242 - 250