AUGER SPECTROMETRY OF PASSIVATED FILMS FORMED ON TANTALUM IN PHOSPHORIC-ACID SOLUTION

被引：4

作者：

ROMAND, M

BOUYSSOUX, G

SOLOMON, JS

BAUN, WL

机构：

[1] UNIV LYON 1,CNRS,CHIM APPL & GENE CHIM LAB,F-69621 VILLEURBANNE,FRANCE

[2] UNIV DAYTON,INST RES,DAYTON,OH 45400

[3] USAF,MAT LAB,WRIGHT PATTERSON AFB,OH 45433

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1976年 / 9卷 / 01期

关键词：

D O I：

10.1016/0368-2048(76)85005-0

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

页码：41 / 50

页数：10

共 12 条

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[3]

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[6] USE OF AUGER-ELECTRON SPECTROSCOPY AND INERT-GAS SPUTTERING FOR OBTAINING CHEMICAL PROFILES [J].

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[7]

ROMAND M, TO BE PUBLISHED

[8]

RONDOT B, 1975, VIDE, V179, P70

[9] CHEMICAL-SHIFTS IN AUGER-SPECTRA OF PASSIVE FILMS [J].

SEO, M ;

LUMSDEN, JB ;

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SURFACE SCIENCE, 1974, 42 (01) :337-339

[10] DIGITIZING AUGER DATA - THREEFOLD APPROACH TO ENHANCE ANALYTICAL CAPABILITIES [J].

SOLOMON, JS ;

BAUN, WL .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :375-378

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