COMPARISON OF FACTOR-ANALYSIS AND CURVE-FITTING FOR DATA-ANALYSIS IN XPS

[1] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[2] AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF SODIUM METAL AND SODIUM OXIDE [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (01) : 1 - 31

[3] APPLICATION OF FOURIER-TRANSFORM TECHNIQUES TO PROBLEM OF DECONVOLUTION IN PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (02) : 129 - 148

[4] Briggs D., 1983, PRACTICAL SURFACE AN

[5] Carlson T. A., 1972, Journal of Electron Spectroscopy and Related Phenomena, V1, P161, DOI 10.1016/0368-2048(72)80029-X

[6] CLARK DT, 1978, POLYM SURFACES, P309

[7] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[8] APPLICATION OF AUGER LINE-SHAPES AND FACTOR-ANALYSIS TO CHARACTERIZE A METAL-CERAMIC INTERFACIAL REACTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 458 - 461

[9] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[10] APPLICATION OF FACTOR-ANALYSIS TO THE RESOLUTION OF OVERLAPPING XPS SPECTRA [J]. APPLIED SPECTROSCOPY, 1982, 36 (04) : 428 - 430

[1] PRINCIPAL COMPONENT ANALYSIS AS A METHOD FOR SILICIDE INVESTIGATION WITH AUGER-ELECTRON SPECTROSCOPY [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 79 (02): : 489 - 496

[2] AUGER AND X-RAY PHOTOELECTRON SPECTROSCOPIC STUDY OF SODIUM METAL AND SODIUM OXIDE [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 7 (01) : 1 - 31

[3] APPLICATION OF FOURIER-TRANSFORM TECHNIQUES TO PROBLEM OF DECONVOLUTION IN PHOTOELECTRON-SPECTROSCOPY [J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 9 (02) : 129 - 148

[4] Briggs D., 1983, PRACTICAL SURFACE AN

[5] Carlson T. A., 1972, Journal of Electron Spectroscopy and Related Phenomena, V1, P161, DOI 10.1016/0368-2048(72)80029-X

[6] CLARK DT, 1978, POLYM SURFACES, P309

[7] PRINCIPAL COMPONENT ANALYSIS OF AUGER LINE-SHAPES AT SOLID-SOLID INTERFACES [J]. APPLIED SURFACE SCIENCE, 1981, 7 (1-2) : 7 - 18

[8] APPLICATION OF AUGER LINE-SHAPES AND FACTOR-ANALYSIS TO CHARACTERIZE A METAL-CERAMIC INTERFACIAL REACTION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03): : 458 - 461

[9] CHEMICAL CHARACTERIZATION FROM CARBON AUGER-SPECTRA BY APPLICATION OF PATTERN-RECOGNITION AND FACTOR-ANALYSIS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 600 - 604

[10] APPLICATION OF FACTOR-ANALYSIS TO THE RESOLUTION OF OVERLAPPING XPS SPECTRA [J]. APPLIED SPECTROSCOPY, 1982, 36 (04) : 428 - 430