THE FRAGMENTATION OF SPUTTERED CLUSTER IONS AND THEIR CONTRIBUTION TO SECONDARY ION MASS-SPECTRA

被引：34

作者：

DZHEMILEV, NK

RASULEV, UK

VERKHOTUROV, SV

机构：

[1] Uzbek Acad of Sciences, Tashkent, USSR, Uzbek Acad of Sciences, Tashkent, USSR

来源：

关键词：

D O I：

10.1016/0168-583X(87)90065-6

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：531 / 536

页数：6

共 21 条

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[4]

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[5]

DZHEMILEV NK, 1979, IZV AN SSSR FIZ+, V43, P606

[6]

DZHEMILEV NK, 1985, IZV AN SSSR FIZ+, V49, P1831

[7]

DZHEMILEV NK, 1983, SECONDARY ION ION PH, P27

[8]

DZHEMILEV NK, 1985, 7TH INT C ION BEAM A, P118

[9]

DZHEMILEV NK, 1985, 7TH INT C ION BEAM A, P119

[10]

GERHARD W, 1975, Z PHYS B CON MAT, V22, P31, DOI 10.1007/BF01325457