LOCAL MAGNETORESISTIVE RESPONSE IN THIN-FILM NI-FE READ ELEMENTS - A SUB-MICROMETER-RESOLUTION MEASUREMENT SYSTEM

被引:8
作者
CROSS, RW [1 ]
KOS, AB [1 ]
THOMPSON, CA [1 ]
PETERSEN, TW [1 ]
机构
[1] HEWLETT PACKARD CO,DEPT THIN FILM,PALO ALTO,CA 94304
关键词
Barkhausen noise - Four-probe resistance measurement - Magnetic read heads - Magnetoresistive response - Thin-film read elements;
D O I
10.1109/20.179716
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Bulk and local magnetoresistive responses in Ni-Fe thin films were measured as a function of applied magnetic field and field angle. The measurements were made using a four-probe resistance measurement system, which consisted of two scanning micro-probes for voltage taps, each less than 1-mu-m in tip diameter. The scanning resolution of the micro-probes was 0.5-mu-m. The system was used to determine domain formation and motion in magnetoresistive read heads. Longitudinal fields, produced by demagnetizing or external field components, may cause domain formation and subsequent domain-wall motion (and annihilation). This leads to Barkhausen noise, which is detrimental to the performance of the device as a magnetic read head. Experimental results for both the bulk and local responses were in qualitative agreement with micromagnetic theory.
引用
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页码:3060 / 3065
页数:6
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