DIFFUSION STUDIES IN CR-PT THIN-FILMS USING AUGER-ELECTRON SPECTROSCOPY

被引：21

作者：

DANYLUK, S ^{[1
]}

MCGUIRE, GE ^{[1
]}

KOLIWAD, KM ^{[1
]}

YANG, MG ^{[1
]}

机构：

[1] TEXAS INST INC,DALLAS,TX 75222

来源：

THIN SOLID FILMS | 1975年 / 25卷 / 02期

关键词：

D O I：

10.1016/0040-6090(75)90066-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：483 / 489

页数：7

共 15 条

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[10] DIFFUSION MEASUREMENTS IN THIN-FILMS UTILIZING WORK FUNCTION CHANGES - CR INTO AU [J].

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