SUPERPOSITION OF CHROMATIC ERROR AND BEAM BROADENING IN TRANSMISSION ELECTRON-MICROSCOPY OF THICK CARBON AND ORGANIC SPECIMENS

被引:31
作者
REIMER, L [1 ]
GENTSCH, P [1 ]
机构
[1] UNIV MUNSTER,INST PHYS,ELEKTRONENMIKROSKOP ABT,D-4400 MUNSTER,FED REP GER
关键词
D O I
10.1016/S0304-3991(75)80003-9
中图分类号
TH742 [显微镜];
学科分类号
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页码:1 / 5
页数:5
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