SUPERPOSITION OF CHROMATIC ERROR AND BEAM BROADENING IN TRANSMISSION ELECTRON-MICROSCOPY OF THICK CARBON AND ORGANIC SPECIMENS

被引：31

作者：

REIMER, L ^{[1
]}

GENTSCH, P ^{[1
]}

机构：

[1] UNIV MUNSTER,INST PHYS,ELEKTRONENMIKROSKOP ABT,D-4400 MUNSTER,FED REP GER

来源：

ULTRAMICROSCOPY | 1975年 / 1卷 / 01期

关键词：

D O I：

10.1016/S0304-3991(75)80003-9

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：1 / 5

页数：5

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