共 23 条
[1]
APPLICATION OF LOW-ANGLE RUTHERFORD BACKSCATTERING AND CHANNELING TECHNIQUES TO DETERMINE IMPLANTATION INDUCED DISORDER PROFILE DISTRIBUTIONS IN SEMICONDUCTORS
[J].
NUCLEAR INSTRUMENTS & METHODS,
1980, 168 (1-3)
:283-288
[2]
ASTAKHOV VP, 1971, SOV PHYS SEMICOND+, V4, P1826
[3]
BAYERL P, 1979, 1978 P ION BEAM MOD, P1187
[4]
BORDERS JA, 1971, 2 INT C ION IMPL SEM, P241
[5]
HIGH-DOSE NITROGEN IMPLANTATION IN MONO-CRYSTALLINE SILICON - DOSES AND ANNEALING CONDITIONS FOR OBTAINING BURIED INSULATING HOMOGENEOUS LAYER
[J].
REVUE DE PHYSIQUE APPLIQUEE,
1980, 15 (03)
:647-652
[6]
BOURQUET P, 1980, J APPL PHYS, V15, P6169
[9]
DEZALDIVAR JS, 1981, P BADEN BADEN C