THE APPLICATION OF NITROGEN ION-IMPLANTATION IN SILICON TECHNOLOGY

被引:42
作者
JOSQUIN, WJMJ
机构
来源
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH | 1983年 / 209卷 / MAY期
关键词
D O I
10.1016/0167-5087(83)90855-4
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:581 / 587
页数:7
相关论文
共 23 条
[1]   APPLICATION OF LOW-ANGLE RUTHERFORD BACKSCATTERING AND CHANNELING TECHNIQUES TO DETERMINE IMPLANTATION INDUCED DISORDER PROFILE DISTRIBUTIONS IN SEMICONDUCTORS [J].
AHMED, NAG ;
CHRISTODOULIDES, CE ;
CARTER, G ;
NOBES, MJ ;
TITOV, AI .
NUCLEAR INSTRUMENTS & METHODS, 1980, 168 (1-3) :283-288
[2]  
ASTAKHOV VP, 1971, SOV PHYS SEMICOND+, V4, P1826
[3]  
BAYERL P, 1979, 1978 P ION BEAM MOD, P1187
[4]  
BORDERS JA, 1971, 2 INT C ION IMPL SEM, P241
[5]   HIGH-DOSE NITROGEN IMPLANTATION IN MONO-CRYSTALLINE SILICON - DOSES AND ANNEALING CONDITIONS FOR OBTAINING BURIED INSULATING HOMOGENEOUS LAYER [J].
BOURGUET, P ;
DUPART, JM .
REVUE DE PHYSIQUE APPLIQUEE, 1980, 15 (03) :647-652
[6]  
BOURQUET P, 1980, J APPL PHYS, V15, P6169
[7]   LOW-ENERGY NITROGEN IMPLANTATION INTO SILICON - ITS MATERIAL COMPOSITION, OXIDATION RESISTANCE, AND ELECTRICAL CHARACTERISTICS [J].
CHIU, TY ;
BERNT, H ;
RUGE, I .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1982, 129 (02) :408-412
[8]   EPITAXIAL SILICON LAYERS GROWN ON ION-IMPLANTED SILICON-NITRIDE LAYERS [J].
DEXTER, RJ ;
PICRAUX, ST ;
WATELSKI, SB .
APPLIED PHYSICS LETTERS, 1973, 23 (08) :455-457
[9]  
DEZALDIVAR JS, 1981, P BADEN BADEN C
[10]   THERMAL-OXIDATION RATE OF A SI3N4 FILM AND ITS MASKING EFFECT AGAINST OXIDATION OF SILICON [J].
ENOMOTO, T ;
ANDO, R ;
MORITA, H ;
NAKAYAMA, H .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1978, 17 (06) :1049-1058