HELIUM TRAPPING IN NICKEL AND THE USE OF THE HELIUM PROBE AS A TECHNIQUE FOR DEFECT AND GAS AGGLOMERATION STUDIES

被引：2

作者：

BAILEY, P ^{[1
]}

ARMOUR, DG ^{[1
]}

KARPUZOV, DS ^{[1
]}

CARTER, G ^{[1
]}

机构：

[1] UNIV SALFORD,THIN FILM & SURFACE RES CTR,SALFORD M5 4WT,LANCS,ENGLAND

来源：

RADIATION EFFECTS AND DEFECTS IN SOLIDS | 1983年 / 78卷 / 1-4期

关键词：

D O I：

10.1080/00337578308207366

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 ; 082701 ;

摘要：

引用

页码：133 / 146

页数：14

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