INTENSITY AND ENERGY CALIBRATION IN AES - THE EFFECT OF ANALYZER MODULATION

被引：45

作者：

ANTHONY, MT

SEAH, MP

机构：

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1983年 / 32卷 / 01期

关键词：

D O I：

10.1016/0368-2048(83)85069-5

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

引用

收藏

页码：73 / 86

页数：14

相关论文

共 20 条

[1] BAUER HE, 1977, 7TH P INT VAC C 3RD, P2371
[2] DAVIS LE, 1976, HDB AUGER ELECTRON S
[3] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS
HARRIS, LA
[J]. JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) : 1419 - &
[4] METHOD OF BACKGROUND DETERMINATION IN QUANTITATIVE AUGER-SPECTROSCOPY
HESSE, R
LITTMARK, U
STAIB, P
[J]. APPLIED PHYSICS, 1976, 11 (03): : 233 - 239
[5] INSTRUMENT RESPONSE FUNCTIONS FOR POTENTIAL MODULATION DIFFERENTIATION
HOUSTON, JE
PARK, RL
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1972, 43 (10) : 1437 - &
[6] CHEMICAL INFORMATION FROM AUGER-ELECTRON SPECTROSCOPY
MADDEN, HH
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1981, 18 (03): : 677 - 689
[7] MCGUIRE GE, 1979, AUGER ELECTRON SPECT
[8] RESULTS OF A JOINT AUGER ESCA ROUND ROBIN SPONSORED BY ASTM-COMMITTEE-E-42-ON-SURFACE-ANALYSIS .2. AUGER RESULTS
POWELL, CJ
ERICKSON, NE
MADEY, TE
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1982, 25 (2-3) : 87 - 118
[9] THEORETICAL COMPARISON OF ELECTRON-ENERGY ANALYZERS DEGRADED SO AS TO OBTAIN HIGH SENSITIVITY
PRUTTON, M
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) : 197 - 204
[10] Seah M. P., 1979, Surface and Interface Analysis, V1, P91, DOI 10.1002/sia.740010305